DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS

Abstract

We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data. © 2022 Sciendo. All rights reserved. --//-- This is an open access article Ozols A., Mozolevskis G., Zalubovskis R., Rutkis M. DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS (2022) Latvian Journal of Physics and Technical Sciences, 59 (4), pp. 25 - 35, DOI: 10.2478/lpts-2022-0031 published under the CC BY-NC-ND 4.0 licence.