Understanding of conversion process of magnetron deposited thin films of amorphous ReOx to crystalline ReO3 upon thermal annealing

Abstract

Thin films of rhenium trioxide (ReO3) were produced by reactive DC magnetron sputtering from metallic rhenium target followed by annealing in the air in the range of temperatures from 200C to 350C. Nanocrystalline single-phase ReO3 films were obtained upon annealing at about 250C. The thin films appear bright red in reflected light and blue-green in transmitted light, thus showing an optical transparency window in the spectral range of 475-525 nm. The film exhibits high conductivity, evidenced by macro- and nano-scale conductivity measurements. The long-range and local atomic structures of the films were studied in detail by structural methods as X-ray diffraction and X-ray absorption spectroscopy. The oxidation state (6+) of rhenium was confirmed by X-ray photoemission and X-ray absorption spectroscopies. The nanocrystalline morphology of the annealed films was evidenced by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM). The obtained results allowed us to propose the mechanism of rhenium oxide conversion from the initially amorphous ReOx phase to cubic ReO3.