| dc.creator | Bhattacharyya, A.S | |
| dc.creator | Ramgiri, Praveen Kumar | |
| dc.date | 2015 | |
| dc.date.accessioned | 2016-09-21T12:00:59Z | |
| dc.date.available | 2016-09-21T12:00:59Z | |
| dc.identifier | http://scireprints.lu.lv/290/1/thickness_-residul_stress.pdf | |
| dc.identifier | Bhattacharyya, A.S and Ramgiri, Praveen Kumar (2015) Thin films stress modeling : a novel approach. (Unpublished) | |
| dc.identifier.uri | https://dspace.lu.lv/dspace/handle/7/34414 | |
| dc.description | A novel approach to estimate the thin film stress was discussed based on surface tension. The effect of temperature and film thickness was studies. The effect of stress on the film mechanical properties was observed. | |
| dc.format | application/pdf | |
| dc.relation | http://scireprints.lu.lv/290/ | |
| dc.subject | Q01 Interdisciplinary sciences (General) | |
| dc.title | Thin films stress modeling : a novel approach | |
| dc.type | Article | |
| dc.type | NonPeerReviewed | |
