Browsing B6 – LU institūti un aģentūras / Institutes and agencies of the UL by Subject "scanning Kelvin probe"
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Influence of organic material and sample parameters on the surface potential in Kelvin probe measurements
(Springer New York LLC, 2019)Scanning Kelvin probe is a method for material surface studies. It is used to determine the work function of metals. In the case of organic semiconductors, the measured surface potential is considered to be the Fermi level ...